Time-dependent theory of charge transfer in the field ionization process at surfacesGRÜNDLER, W.Surface science. 1992, Vol 266, Num 1-3, pp 137-140, issn 0039-6028Conference Paper

Field Emission '98 Proceedings of the 45th Internatonal Field Emission SymposiumMOUSA, M. S; DANOIX, F.Ultramicroscopy. 1999, Vol 79, Num 1-4, issn 0304-3991, 317 p.Conference Proceedings

IFES'92 International field emission symposiumMILLER, Michael K; KREUZER, H. Jürgen.Applied surface science. 1993, Vol 67, Num 1-4, issn 0169-4332Conference Proceedings

Intergranular precipitation in Ni-Cr-Fe alloysSTILLER, K.Surface science. 1992, Vol 266, Num 1-3, pp 402-408, issn 0039-6028Conference Paper

The thermal faceting of surfaces by low coverage adsorption. A model and analyses of field emission microscope experimentsDRECHSLER, M.Surface science. 1992, Vol 266, Num 1-3, pp 1-10, issn 0039-6028Conference Paper

Field emission'91MITTERAUER, Johannes.Surface science. 1992, Vol 266, Num 1-3, pp XXI-XXV, issn 0039-6028, 567 p.Conference Proceedings

Surface reactions in an external electrostatic fieldBRAGIEL, P.Surface science. 1992, Vol 266, Num 1-3, pp 35-39, issn 0039-6028Conference Paper

The role of atom-probe techniques in the investigation of some selected metallurgical problemsBLAVETTE, D.Surface science. 1992, Vol 266, Num 1-3, pp 299-309, issn 0039-6028Conference Paper

Field emission from diamond and related filmsXU, N. S.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 59-72, issn 0304-3991Conference Paper

Field emission of carbon fibersSHESHIN, E. P.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 101-108, issn 0304-3991Conference Paper

Field Emission '97 International Field Emission SymposiumHONO, K; TSUKADA, M.Ultramicroscopy. 1998, Vol 73, Num 1-4, issn 0304-3991, 305 p.Conference Proceedings

High temperature supercondutors in strong electric fieldsSHKURATOV, S. I.Surface science. 1992, Vol 266, Num 1-3, pp 88-99, issn 0039-6028Conference Paper

Barrier-resonance states in an external electric fieldJURCZYSZYN, L; STESLICKA, M.Surface science. 1992, Vol 266, Num 1-3, pp 141-144, issn 0039-6028Conference Paper

Changes in the morphology of Rh field emitter tips due to the reaction with carbon monoxideKRUSE, N; GAUSSMANN, A.Surface science. 1992, Vol 266, Num 1-3, pp 51-55, issn 0039-6028Conference Paper

Microfabricated field-emission and field-ionization sourcesSPINDT, C. A.Surface science. 1992, Vol 266, Num 1-3, pp 145-154, issn 0039-6028Conference Paper

Surface diffusion of Pt adatoms on NI surfacesKELLOGG, G. L.Surface science. 1992, Vol 266, Num 1-3, pp 18-23, issn 0039-6028Conference Paper

Tunneling in the representation of scattering statesVALEYEV, V. G.Surface science. 1992, Vol 266, Num 1-3, pp 274-281, issn 0039-6028Conference Paper

Simulations of photon-assisted field emission : Their significance in basic science and device applicationsHAGMANN, M. J.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 115-124, issn 0304-3991Conference Paper

Field electron emission on zinc oxide coated tungsten microemittersMOUSA, M. S.Surface science. 1992, Vol 266, Num 1-3, pp 110-120, issn 0039-6028Conference Paper

Implementation of the optical atom probeMILLER, M. K.Surface science. 1992, Vol 266, Num 1-3, pp 494-500, issn 0039-6028Conference Paper

Surface self-diffusion studies on the W(112) plane by the field emission methodYUN MING GONG.Surface science. 1992, Vol 266, Num 1-3, pp 30-34, issn 0039-6028Conference Paper

Comments and references relating to early work in field electron emissionKLEINT, Christian.Surface and interface analysis. 2004, Vol 36, Num 5-6, pp 387-390, issn 0142-2421, 4 p.Conference Paper

Proposed XML-based three-dimensional atom probe data standardMILLER, M. K.Surface and interface analysis. 2004, Vol 36, Num 5-6, pp 601-605, issn 0142-2421, 5 p.Conference Paper

Use of energy-space diagrams in free-electron models of field electron emissionFORBES, Richard G.Surface and interface analysis. 2004, Vol 36, Num 5-6, pp 395-401, issn 0142-2421, 7 p.Conference Paper

Methods for atom probe study of near surface zones in cemented carbidesFRYKHOLM, R; ANDREN, H.-O.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 283-286, issn 0304-3991Conference Paper